Technique for in situ measurement of free spectral range and transverse mode spacing of optical cavities.
نویسندگان
چکیده
Length and g-factor are fundamental parameters that characterize optical cavities. We developed a technique to measure these parameters in situ by determining the frequency spacing between the resonances of fundamental and spatial modes of an optical cavity. Two laser beams are injected into the cavity, and their relative frequency is scanned by a phase-lock loop, while the cavity is locked to either laser. The measurement of the amplitude of their beat note in transmission reveals the resonances of the longitudinal and the transverse modes of the cavity and their spacing. This method proves particularly useful to characterize complex optical systems, including very long and/or coupled optical cavities, as in gravitational-wave interferometers. This technique and the results of its application to the coupled cavities of a 40 m-long gravitational-wave interferometer prototype are presented here.
منابع مشابه
Suppression of Four Wave Mixing Based on the Pairing Combinations of Differently Linear-Polarized Optical Signals in WDM System
Data transmission in optical systems and increased transmission distance capacity benefit by using optical amplification wavelength division multiplexing (WDM) technology. The combination of four waves (FWM) is a non-linear effect in the wavelength division multiplex (WDM), when more than two wavelengths of light in a fiber launch will occur. FWM amount depends on the channel, the channel spaci...
متن کاملElimination of Chemical and Spectral Interferences in Measurement of Trace Elements in Urine and Blood by Combined Electrodeposition-Electrothermal Atomic Absorption Spectrometry
A combined electrodeposition-ETAAS technique has been applied to the analysis of Pb, Cd, Co, Ni, Cr and Mn in biological samples in order to overcome interferences and to minimize sample pretreatment. It requires minimal sample preparation with the electrolysis process aiding partial decomposition of the organic matrix, adequate for the release and deposition of trace elements. In an initia...
متن کاملError Analysis, Design and Modeling of an Improved Heterodyne Nano-Displacement Interferometer
A new heterodyne nano-displacement with error reduction is presented. The main errors affecting the displacement accuracy of the nano-displacement measurement system including intermodulation distortion error, cross-talk error, cross-polarization error and phase detection error are calculated. In the designed system, a He-Ne laser having three-longitudinal-mode is considered as the stabiliz...
متن کاملSideband spectroscopy and dispersion measurement in microcavities.
The measurement of dispersion and its control have become important considerations in nonlinear devices based on microcavities. A sideband technique is applied here to accurately measure dispersion in a microcavity resulting from both geometrical and material contributions. Moreover, by combining the method with finite element simulations, we show that mapping of spectral lines to their corresp...
متن کاملOPTICAL PROPERTIES OF THIN Cu FILMS AS A FUNCTION OF SUBSTRATE TEMPERATURE
Copper films (250 nm) deposited on glass substrates, at different substrate temperatures. Their optical properties were measured by ellipsometery (single wavelength of 589.3 nm) and spectrophotometery in the spectral range of 200–2600 nm. Kramers Kronig method was used for the analysis of the reflectivity curves of Cu films to obtain the optical constants of the films, while ellipsometery measu...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
- Applied optics
دوره 51 27 شماره
صفحات -
تاریخ انتشار 2012